Cutting-edge Imaging Technologies Bolstering Various Scientific Fields
The imaging technologies for enlarging, observing, and analyzing minute areas are indispensable for research and development, quality control, and failure analysis both in academic and business sectors. At the same time, to win global competition, it is imperative to understand and use speedily and accurately the information obtained with these technologies. We are contributing to the development of science and technology with our leading-edge and unique imaging solutions including Scanning Electron Microscopes, Focused Ion Beam Scanning Electron Microscopes, Indentation hardness and young’s modulus measurement systems(Nanoindentation system) and Cantilevers for Scanning Probe Microscopes.
- Scanning Electron Microscopes
- FIB-SEM (Focused Ion Beam Scanning Electron Microscopes)
- Super Resolution Microscopes
- Scanning Probe Microscopes
- Hardness and Young's Modulus Measurement Systems
- Image Analysis Software
- Cantilever for Scanning Probe Microscope
- Fraunhofer IWS
- Image Metrology A/S
- nanotools GmbH
- NanoWorld AG
- TESCAN ORSAY HOLDING, a.s.