１）Products developed by TOYO Corporation

TFT-LCD panel measurement system Model LCM-3

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Model LCM-3 is the first system to measure contaminations in actual TFT-LCD panel. The measurement method is based on Ion Density measurement which applies triangle voltage waveform to LC test panels without TFT pixels, and then measures small current. Model LCM-3 has additional output signals to drive gate in TFT pixels and other input signal terminals. These measurement results correspond to the cause of Image Sticking, Flicker phenomena, and so on. This system could be used not only material selection such as LC, alignment film, sealant, color filters, but also process control for TFT-LCD panel fabrications.

LC Material Characteristics Measurement System Model 6254

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This Model 6254 is a new system developed to measure the voltage holding ratio, ion density, residual DC voltage, and transient current in one measurement module. Use of only one measurement module makes it possible to perform each measurement. Up to eight measurement modules can be mounted on this system. This ensures the measurement of multiple samples in a short time.   In particular, the measurement time of the residual DC voltage measurement, which normally requires a long measurement time, is reduced to the same level as the measurement time of one panel for up to eight channels. This greatly reduces the total measurement time.

Ion Density Measurement System Model MTR-1

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One of factors causing display failure of the LCD is impurity ion inside the panel. However, it was difficult to quantitatively measure the volume of such ion and its secular change. To solve this problem, MERCK JAPAN and TOYO Corporation have jointly developed this Ion Density Measurement System Model MTR-1. This system applies low-frequency triangular waveforms to an LC cell and analyzes Lissajous' waveforms of the current and voltage signals to calculate the ion density inside the LC cell.

Voltage Holding Ratio Measurement System Model VHR-1

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The voltage holding ratio measurement is an evaluation method absolutely necessary for the research, development, and manufacture processes of TFT-LCD panels. However, since the impedance of an LC test cell to be evaluated is very high, it was difficult to accurately measure a voltage holding ratio of 99% or more. This Model VHR-1A uses a high-resolution A/D converter and a high-voltage sample & hold amplifier to accurately measure the holding ratio. Additionally, the Model VHR-1S is very convenient to improve the measurement efficiency when measuring multiple samples or a part of the matrix panel.

Transient Current (γ1) Measurement System Model TCM-1

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The transient current measurement of the LC cell has become remarkable as the requirements for measurement of low viscosity of LC materials have been increased along with practical use of the IPS and high-speed display of the STN panel, and the requirements for measurement of the panel resistance and impurity ion have been greatly increased. The conventional measurement of the rotation viscosity (γ1) needs specific equipment, such as a magnetic field generation system and other units. Additionally, this measurement can be made only in the bulk state. However, this newly developed system does not require any magnetic field generation system and can measure the data (current value and time of the director switching peak or impurity ion peak) necessary to calculate the rotation viscosity (γ1) of the LC cell.

LC Specific Resistance Measurement System Model SR-6517

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It is said that the specific resistance measurement is very important for the quality control of LC materials. However, the fluorine nematic LC used for TFT-LCD has the tendency that the specific resistance becomes high. Therefore, a measurement having higher sensitivity is required. This Model SR-6517 is composed of a highly sensitive electrometer/source, a liquid electrode to supply the liquid crystal, and a shield box to protect the liquid electrode from noise, ensuring measurement of LC materials having a high specific resistance.

Elastic Constant Measurement System Model EC-1

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It is known well that the elastic constant is one of important material characteristic values of LC materials. This Model EC-1 is designed to measure K11 (spray) and K33 (bend) by means of the measurement method using Freedericksz transition. Additionally, the Model EC-1 can also measure the dielectric constant anisotropy (Δε).

OLED Evaluation System Model 6730　

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The OLED is expected as a next-generation display device. Since this OLED is driven by the current, different from the LCD, it is difficult to measure the service life of this display device using the conventional voltage drive measurement system. This Model 6730 is a new system that drives the OLED by arbitrary current waveforms to measure electro-optic characteristics.

Driver amplifier for PDP Model HVA-800

・	This Model HVA-800 is a voltage amplifier having a maximum output of 800Vp-p. As this Model HVA-800 is combined with an arbitrary waveform generator, a specified part of the PDP can be evaluated.

２）Jointly developed products

LC Alignment Layer Evaluation System PI-Checker

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This PI-Checker is a system designed to measure the optical anisotropism of the polyimide alignment layer on the LC glass substrate.The measurement method used for this model is developed based on the measurement principle developed by NEC Electronics (previous company name was NEC Electron Device). As this anisotropism is measured, it is possible to quantify the rubbing, burning, and washing processes of the alignment layer using the numeric data. Additionally, it is also possible to calculate the layer thickness and dielectric constant of the alignment layer (uniaxial and isotropic), and tilt angle of the surface through the simulation fitting of the measured results.

３)The others

Pretilt Analysis System Model PAS-301

・	The PAS-301 Pretilt Analysis System is a research and development tool designed to provide an affordable means for determining the pretilt angle and cell gap of antiparallel, TN and VA liquid crystal test cells with using the crystal rotation method.