Control unit

Control unit
 
control01.jpg   The control unit automatically controls the various measuring devices necessary for Hall measurement with the software. 
Based on the values read by these devices, the control unit can calculate semiconductor parameters such as resistivity, carrier density and mobility etc. 
It has been designed by Toyo Corporation based on its great experience in the field of Hall measurement of new generation semiconductor materials to improve the measurement accuracy and operationality.
 
Main program specifications  
 Ohmic measurement
I-V measurement by current sweep (LOG current, linear current division) up to maximum 100 points
I-V characteristics are displayed with table or graph.
 
 Hall measurement
AC magnetic field Hall measurement, DC magnetic field Hall measurement can be selected.
Carrier type, Hall coefficient, carrier density, sheet carrier density and mobility can be displayed.
Noise ratio, drift rate, direction dependency are displayed in numerical value and reliability and error range are quantitatively evaluated.
Auto setup function which matches the AC magnetic field frequency, pre-amp gain and applied current to resistance of the sample.
 
 Measurement of resistivity
Measurement by Van der Pauw method.
Resistivity, sheet resistance are displayed.
 
 Temperature adjustment
Temperature sweep (maximum 500 points)
Displayed by table or graph
 
 File input/output
Setup, setup + data are saved in a file and can be read.
File export to CSV format

  
Lineup
 
Desktop PC
t_line-285x5.gif
Software
GPIB interface
Desktop PC
LCD
Printer
PC rack
Laptop PC
t_line-285x5.gif
Software
GPIB interface
Laptop PC
Printer
PC rack

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